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DC Tester Product List

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DC Tester "431-TT"

DC Tester "431-TT"

Supports large current and high voltage measurements, as well as high-speed and parallel measurements! Flexible and diverse system configurations are possible.

The "431-TT" is a new concept DC tester that inherits the know-how of power device measurement and adopts a V/I source measurement module. It features an open architecture, allowing for flexible and diverse system configurations. It supports high current and high voltage measurements, as well as high-speed and parallel measurements, and includes maintenance functions such as waveform monitoring on the operation screen. 【Features】 ■ VI source measurement module configuration ■ Capable of measuring up to 1.2KV/130A (maximum 2.2KV/200A) ■ High-speed measurement ■ Multi-device testing (testing two DUTs simultaneously, such as 2-in-1 devices) ■ Wafer parallel testing (simultaneous measurement of two chips) *For more details, please refer to the PDF document or feel free to contact us.

  • Tester

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DC Tester "471-TT"

DC Tester "471-TT"

Improved cost performance through simultaneous measurement of multiple chips! Measurement of 2KV/20A is possible.

The "471-TT" is a DC tester that achieves a significant reduction in data communication time by adopting LAN technology. By utilizing the measurement techniques accumulated over many years, it enables simultaneous measurement of multiple chips in the wafer measurement process. It also inherits our strengths in high voltage and high current measurement technology. By processing simultaneous measurements of multiple chips, it significantly improves productivity compared to conventional testers. 【Features】 ■ Improved cost performance through simultaneous measurement of multiple chips (8 parallel/16 parallel) ■ Significant reduction in data communication time by adopting LAN technology ■ Reduction in measurement time through accelerated relay switching ■ Stable measurements in parallel measurement, leveraging our measurement technology (Max 2kV/20A) ■ Capability to set voltage/current limits, reducing the load on probe pins ■ Automatically divides and sets the number of chips to be measured simultaneously to be below the pre-set maximum current value (current capacity of the prober chuck) *For more details, please refer to the PDF document or feel free to contact us.

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【For Mid-level】DC Measurement for Semiconductors: Open Short and Leak Test

【For Mid-level】DC Measurement for Semiconductors: Open Short and Leak Test

Guide to Semiconductor Test Programs Using "LabVIEW" - DC Measurement Edition

We present a practical programming guide useful in the manufacturing field for mid-level engineers. This time, we will cover how to create a program for conducting open-short-leak tests on semiconductors. Engineers at semiconductor manufacturers are troubled by inspection speed and inspection accuracy. This is recommended for those who want to engage in deeper discussions with equipment manufacturers about inspection speed and accuracy, and for those who want to customize the process themselves. In this text, we will explain how to create a DC test program using measuring instruments and real optocouplers that are used in the field. This is a must-check for anyone involved in semiconductors!

  • Technical and Reference Books
  • Technical Seminar
  • Semiconductor inspection/test equipment

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